Electron Microscopy · foundry-ml
direct_electron_detectorceleritas_xs_simulated_readout_images_electron_counting_model_v1-1
Simulated Celeritas XS readout images for training electron-counting models in cryo-EM and STEM.
What direct_electron_detectorceleritas_xs_simulated_readout_images_electron_counting_model_v1-1 is
This dataset provides simulated readout images from a Celeritas XS direct-electron detector, published by foundry-ml. Direct-electron detectors capture incoming electrons directly without converting them to light first, but identifying discrete electron events from raw sensor signals requires calibrated detection methods.
The dataset provides synthetic training examples to support the development and optimisation of electron-counting models in materials science and physics. These models are intended for use in cryogenic electron microscopy (cryo-EM) and scanning transmission electron microscopy (STEM) workflows.
How it was made
The collection consists of simulated sensor readout frames modelling the response of a Celeritas XS direct-electron detector. These frames provide the input data necessary to train algorithms and machine learning models to localise and count individual electron strikes.
Key facts
- Publisher
- foundry-ml
- Detector modelled
- Celeritas XS direct-electron detector
- Data type
- Simulated readout images
- Primary application
- Electron-counting model training
- Scientific fields
- Materials science, physics
- Microscopy techniques
- Cryo-EM, STEM
What you can use it for
- Cryo-EM electron counting
- Training machine learning models to detect and count individual electron events in simulated cryogenic electron microscopy readouts.
- STEM event identification
- Developing counting algorithms for scanning transmission electron microscopy to convert detector readouts into discrete electron counts.
- Detector-specific model calibration
- Benchmarking electron-identification pipelines tuned specifically to the characteristics of the Celeritas XS sensor.
Explore the data
No licence declared
The authors have not published a licence, which means no permission to redistribute the data has been granted to anyone. The rows are not served here; read them on the original dataset page.Strengths and limits
Good at
- Provides simulated detector readouts designed specifically for Celeritas XS direct-electron counting models.
- Supports algorithm development across both cryo-EM and STEM imaging modalities.
Watch out for
- Comprises synthetic detector readouts rather than experimental microscopy images.
- Focuses on the Celeritas XS sensor and may not reflect the noise profiles or characteristics of other direct-electron detector models.
Questions
Can I look inside direct_electron_detectorceleritas_xs_simulated_readout_images_electron_counting_model_v1-1 without downloading it?
Not here: it declares no licence, so no permission to redistribute its rows has been granted. Its description and statistics are still shown.
What licence is direct_electron_detectorceleritas_xs_simulated_readout_images_electron_counting_model_v1-1 under?
Its authors have not declared a licence, which means no permission to reuse or redistribute it has been granted.
Which detector is represented in this dataset?
The dataset contains simulated readout images specifically for the Celeritas XS direct-electron detector.
What imaging methods can use these models?
The training data is designed for electron-counting models used in both cryogenic electron microscopy (cryo-EM) and scanning transmission electron microscopy (STEM).
Is this dataset collected from physical microscope sessions?
No, the images are simulated readouts rather than physical, experimentally recorded frames.
Written from direct_electron_detectorceleritas_xs_simulated_readout_images_electron_counting_model_v1-1's own dataset card. Statements citing a figure that does not appear there are removed before publication. Licence and running details come from our registry.